Keysight Technologies' Method Of Implementation Now Supports MIPI D-PHY v1.1 Interface S-Parameters And Impedance Testing Using ENA Network Analyzer

Keysight Technologies, Inc. recently announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 1.1 of the MIPI Alliance Specification for D-PHY. The MOI, together with a test package such as a state file (which makes setup and measurement easy) works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).

Modern mobile devices require a physical layer (PHY) capable of handling high-speed data signals with low-power consumption through their interfaces. MIPI D-PHY is a high-frequency, very low-power PHY standard for protocols such as CSI and DSI. These protocols are used to connect devices such as cameras and displays within mobile devices. To ensure these interfaces comply with the MIPI D-PHY specification, they must be tested under actual operating conditions and in accordance with the D-PHY Conformance Test Suite version 1.1.

Keysight’s MOI eases this process by providing engineers with a measurement guide of procedures for the interface S-parameter and impedance tests defined in the latest MIPI D-PHY specification. Using the MIPI D-PHY v1.1 MOI and state files, semiconductor and product integrator manufacturers are able to more efficiently perform conformance tests to the standard with the E5071C-TDR.

“Keysight MOIs are available for a number of different high-speed digital applications like HDMI, USB and PCI Express,” said Akira Nukiyama, vice president and general manager, Keysight’s Component Test Division. “Our newest addition to this list, the MIPI D-PHY V1.1 MOI, is just one more example of how we are working to give our customers the functionality they need to address any high-speed measurement challenge.”

The MIPI D-PHY v1.1 MOI for use with the E5071C-TDR is available now at www.keysight.com/find/ena-tdr_compliance. Additional information on MOI for transmitter/receiver interface S-parameter and impedance test is available at www.keysight.com/find/ena-tdr_dphy-txrx. Information on Keysight’s D-PHY test solutions are available at www.keysight.com/find/mipi-dphy. An image of the new ENA Series network analyzer’s enhanced time domain analysis option is available at www.keysight.com/find/ENA-TDR_MIPI_D_MOI_images.

About ENA Option TDR
The E5071C ENA-TDR is an application embedded in the ENA network analyzer that provides a one-box solution for high-speed serial interconnect analysis. The software delivers three breakthroughs for signal integrity design and verification: 1) simple and intuitive operation, 2) fast and accurate measurements simultaneously in the time domain (TDR/TDT) and frequency domain (S-parameter), and 3) ESD robustness for reduction of maintenance cost.

About Keysight Technologies
On Sept. 19, 2013, Agilent Technologies announced plans to separate into two publicly traded companies through a tax-free spinoff of its electronic measurement business. The new company, Keysight Technologies, began operating as a wholly owned subsidiary of Agilent on Aug. 1, 2014 with a full separation anticipated in early November 2014.

Keysight is a global electronic measurement technology and market leader helping to transform its customers’ measurement experience through innovation in wireless, modular, and software solutions. Keysight provides electronic measurement instruments and systems and related software, software design tools and services used in the design, development, manufacture, installation, deployment and operation of electronic equipment. For more information, visit www.keysight.com.